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Using formal specifications to support testing

Article Ecrit par: Hierons, R. M. ; Zedan, Hussein ; Harman, Mark ; Kapoor, Kalpesh ; Bogdanov, Kirill ; Krause, Paul ; Bowen, Jonathan P. ; Luttgen, Gerald ; Cleaveland, Rance ; Simons, Anthony J. H. ; Derrick, John ; Vilkomir, Sergiy ; Dick, Jeremy ; Woodward, Martin R. ; Gheorghe, Marian ;

Résumé: This work was supported by EPSRC Formal Methods and Testing (FORTEST) grant GR/R43150. S. Vilkomir is currently affiliated with East Carolina University. Authors’ addresses: R. M. Hierons, School of Information Systems, Computing, and Mathematics, Brunel University, Uxbridge, Middlesex,UB83PH,U.K.; email: [email protected]; K. Bogdanov, J. Derrick, M. Gheorghe, and A. J. H. Simons, Department of Computer Science, University of Sheffield, Regent Court, 211 Portobello, Sheffield, S1 4DP, U.K.; email: {k.bogdanov,j.derrick,m.gheorghe,a.simons}@dcs.shef.ac.uk; J. P. Bowen and M. Harman, King’s College London, Strand, London, WC2R 2LS, U.K.; email: [email protected], [email protected]; R. Cleaveland, Fraunhofer Center for Experimental Software Engineering, University of Maryland, 4169 A. V. Williams Building, College Park, MD 20742; email: [email protected]; J. Dick, integrate systems engineering ltd., The Gate House, Bailbrook House, London RoadWest, Bath, BA1 7AE, U.K.; email: [email protected]; K. Kapoor, Department of Mathematics, Indian Institute of Technology Guwahati, Guwahati 781 039, India; email: [email protected]; P. Krause, School of ECM, University of Surrey, Guildford, Surrey, GU2 7XH, U.K.; email: [email protected]; G. L¨ uttgen, Department of Computer Science, University of York, Heslington, York, Y010 5DD, U.K.; email: [email protected]; S. Vilkomir, Department of Computer Science, East Carolina University, Greenville, NC 27858; email: [email protected]; H. Zedan, Software Technology Laboratory, De Montfort University, The Gateway, Leicester, LEI 9BH, U.K.; email: [email protected]. Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies show this notice on the first page or initial screen of a display along with the full citation. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, to republish, to post on servers, to redistribute to lists, or to use any component of this work in other works requires prior specific permission and/or a fee. Permissions may be requested from Publications Dept., ACM, Inc., 2 Penn Plaza, Suite 701, New York, NY 10121-0701 USA, fax +1 (212) 869- 0481, or [email protected].


Langue: Anglais